Title :
Fermilab Main Ring ion profile monitor system
Author :
Zagel, J.R. ; Crisp, J.L. ; Halm, A.A. ; Hurh, P.G.
Author_Institution :
Fermi Nat. Accel. Lab., Batavia, IL, USA
Abstract :
An ion profile monitor system is now in operation in the Fermilab Main Ring. This system captures up to 64 K samples of both horizontal and vertical profiles in the Main Ring at a turn by turn sample rate. The hardware and software of the system is described. Some early results are presented
Keywords :
particle beam diagnostics; proton accelerators; synchrotrons; Fermilab Main Ring; horizontal profiles; ion profile monitor system; vertical profiles; Anodes; Communication system control; Control systems; Instruments; Monitoring; Particle beams; Particle production; Printed circuits; Strips; Voltage;
Conference_Titel :
Particle Accelerator Conference, 1997. Proceedings of the 1997
Conference_Location :
Vancouver, BC
Print_ISBN :
0-7803-4376-X
DOI :
10.1109/PAC.1997.751143
