Title :
Using Hopfield neural networks to solve DEA problems
Author :
Hu, Shing-Cheng ; Chung, Yun-Kung ; Chen, Yun-Shiow
Author_Institution :
Dept. of Ind. Eng. & Manage., Yuan Ze Univ., Chungli
Abstract :
Theory and application of both artificial neural networks (ANNs) and data envelopment analysis (DEA) have gone through major growth over the past three decades; nevertheless, using ANN as an optimal algorithm for finding the DEA solution has been limited. In this paper, a Hopfield neural network is applied as a solution tool to DEA models. An illustrative example from a known DEA problem helps to gain insight into the proposed alternative DEA solution method, including its capability and limitations.
Keywords :
Hopfield neural nets; data envelopment analysis; optimisation; DEA problems; Hopfield neural networks; artificial neural networks; data envelopment analysis; optimal algorithm; Artificial neural networks; Data envelopment analysis; Engineering management; Fault tolerance; Hopfield neural networks; Industrial engineering; Neural networks; Predictive models; Production; Training data; Hopfield neural networks; Lagrange function; data envelopment analysis; optimization;
Conference_Titel :
Cybernetics and Intelligent Systems, 2008 IEEE Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-1673-8
Electronic_ISBN :
978-1-4244-1674-5
DOI :
10.1109/ICCIS.2008.4670759
