Title :
FISTEM: a CAD tool for synthesis of easily testable FSM
Author :
Prakash, B. ; Hasan, M.M.
Author_Institution :
Dept. of Electr. Eng., Indian Inst. of Technol., Kanpur, India
Abstract :
In this paper the authors propose a new system named FISTEM for testability synthesis and test generation of PLA-based finite state machines. A nonscan design methodology, based on constrained state assignment and logic optimization, is used which guarantees testability for all combinationally irredundant crosspoint faults in the PLA. Test sequences for these faults are obtained using combinational test generation techniques alone. An exact algorithm is used for this to obtain maximum fault coverage. For different state machines considered, the system works very efficiently to produce an optimized easily testable PLA-based logic implementation with small overhead in area
Keywords :
design for testability; finite state machines; logic CAD; logic arrays; logic testing; CAD tool; FISTEM; PLA-based logic; combinational test generation; constrained state assignment; crosspoint faults; finite state machines; logic optimization; maximum fault coverage; nonscan design methodology; test generation; testability synthesis; testable FSM; Automata; Automatic testing; Constraint optimization; Design automation; Encoding; Logic design; Logic testing; Programmable logic arrays; System testing; Very large scale integration;
Conference_Titel :
ASIC Conference and Exhibit, 1991. Proceedings., Fourth Annual IEEE International
Conference_Location :
Rochester, NY
Print_ISBN :
0-7803-0101-3
DOI :
10.1109/ASIC.1991.242851