• DocumentCode
    334966
  • Title

    Analysis of a single-shot longitudinal bunch profiling system based on an ultra-short pulse Ti:sapphire laser

  • Author

    Tatchyn, R.

  • Author_Institution
    Linear Accel. Center, Stanford Univ., CA, USA
  • Volume
    2
  • fYear
    1997
  • fDate
    12-16 May 1997
  • Firstpage
    2195
  • Abstract
    Recent advances in ultra-short pulse high-power laser technology include the generation of <10 fs pulses at 1 μ wavelengths in the multi-terawatt regime. These parameters, coupled with the high per-pulse energy of the new sources, make possible the consideration of longitudinal bunch profiling schemes capable of accurately registering the longitudinal bunch density in a single shot. In this paper we assess the performance and advantages of a longitudinal bunch profiling system based on multi-photon absorption and fluorescence stimulated by the combined bunch and laser fields in a gaseous medium
  • Keywords
    high-speed optical techniques; measurement by laser beam; particle beam bunching; particle beam diagnostics; combined bunch and laser fields; fluorescence; longitudinal bunch density; longitudinal bunch profiling schemes; multi-photon absorption; single-shot longitudinal bunch profiling system; ultra-short pulse Ti:sapphire laser; ultra-short pulse high-power laser technology; Absorption; Electrons; Gas lasers; Linear particle accelerator; Optical pulse generation; Particle beams; Pulse modulation; Sampling methods; Storage rings; Synchrotron radiation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Particle Accelerator Conference, 1997. Proceedings of the 1997
  • Conference_Location
    Vancouver, BC
  • Print_ISBN
    0-7803-4376-X
  • Type

    conf

  • DOI
    10.1109/PAC.1997.751153
  • Filename
    751153