Title :
Analysis of a single-shot longitudinal bunch profiling system based on an ultra-short pulse Ti:sapphire laser
Author_Institution :
Linear Accel. Center, Stanford Univ., CA, USA
Abstract :
Recent advances in ultra-short pulse high-power laser technology include the generation of <10 fs pulses at 1 μ wavelengths in the multi-terawatt regime. These parameters, coupled with the high per-pulse energy of the new sources, make possible the consideration of longitudinal bunch profiling schemes capable of accurately registering the longitudinal bunch density in a single shot. In this paper we assess the performance and advantages of a longitudinal bunch profiling system based on multi-photon absorption and fluorescence stimulated by the combined bunch and laser fields in a gaseous medium
Keywords :
high-speed optical techniques; measurement by laser beam; particle beam bunching; particle beam diagnostics; combined bunch and laser fields; fluorescence; longitudinal bunch density; longitudinal bunch profiling schemes; multi-photon absorption; single-shot longitudinal bunch profiling system; ultra-short pulse Ti:sapphire laser; ultra-short pulse high-power laser technology; Absorption; Electrons; Gas lasers; Linear particle accelerator; Optical pulse generation; Particle beams; Pulse modulation; Sampling methods; Storage rings; Synchrotron radiation;
Conference_Titel :
Particle Accelerator Conference, 1997. Proceedings of the 1997
Conference_Location :
Vancouver, BC
Print_ISBN :
0-7803-4376-X
DOI :
10.1109/PAC.1997.751153