• DocumentCode
    3350157
  • Title

    Effect of UV irradiation on gas sensing behavior of nanocrystalline ZnO thin films

  • Author

    Soleimanpour, A.M. ; Jayatissa, A.H.

  • Author_Institution
    Ind. & Manuf. Eng. Dept., Univ. of Toledo, Toledo, OH, USA
  • fYear
    2010
  • fDate
    12-15 Oct. 2010
  • Firstpage
    225
  • Lastpage
    229
  • Abstract
    The effect of UV irradiation on ZnO thin film based gas sensor was investigated. Zinc oxide thin films were deposited on an alkali free glass substrate by magnetron sputtering system using zinc target. The UV irradiation of the ZnO thin films was measured to understand the change of microstructure, electrical properties, optical properties and gas sensing characteristics. The X-ray diffraction patterns and SEM images revealed that the films have a nanocrystalline structure. The optical properties of ZnO films were not affected by the UV irradiation significantly. The gas sensing behavior of zinc oxide thin films were enhanced by UV irradiation for a shorter period whereas sensing characteristics were degraded for a longer irradiation period. It was also observed that the dependence of gas sensing characteristics was correlated with the change of electrical properties and crystallinity of films.
  • Keywords
    II-VI semiconductors; X-ray diffraction; gas sensors; nanostructured materials; scanning electron microscopy; semiconductor thin films; sputter deposition; thin film sensors; ultraviolet radiation effects; wide band gap semiconductors; zinc compounds; SEM image; SiO2; UV irradiation; X-ray diffraction pattern; ZnO; alkali free glass substrate; gas sensor; magnetron sputtering; nanocrystalline zinc oxide thin film; zinc target; Films; Gas detectors; Radiation effects; Temperature measurement; Temperature sensors; Zinc oxide; UV irradiation; XRD; Zinc oxide; gas sensing; gas sensor; sputtering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology Materials and Devices Conference (NMDC), 2010 IEEE
  • Conference_Location
    Monterey, CA
  • Print_ISBN
    978-1-4244-8896-4
  • Type

    conf

  • DOI
    10.1109/NMDC.2010.5652439
  • Filename
    5652439