Title :
Stimulus generation using the test pattern development language
Author :
Manley, Mary ; Puffer, David ; Perrey, Karl
Author_Institution :
Intel Corp., Chandler, AZ, USA
Abstract :
Stimulus generation is one of the more challenging tasks in IC design. The Test Pattern Development Language (TPDL) simplifies this process by guaranteeing that simulation patterns are correctly constructed for direct use by the tester. TPDL provides a generic interface which can be used on multiple platforms. The creation of complex stimuli is facilitated via the high level language constructs contained within TPDL
Keywords :
CMOS integrated circuits; VLSI; application specific integrated circuits; circuit layout CAD; formal specification; formal verification; integrated circuit testing; microprocessor chips; CMOS; IC design; TPDL; creation of complex stimuli; generic interface; high level language constructs; microprocessors; multiple platforms; stimulus generation; test pattern development language; Algorithms; Design engineering; High level languages; Maintenance engineering; Standards development; Test pattern generators; Testing; Timing;
Conference_Titel :
ASIC Conference and Exhibit, 1991. Proceedings., Fourth Annual IEEE International
Conference_Location :
Rochester, NY
Print_ISBN :
0-7803-0101-3
DOI :
10.1109/ASIC.1991.242887
