DocumentCode
3350269
Title
The effect of heat treatment on flexibility of silver nanopaste circuit screen-printed on polyimide
Author
Kim, Kwang-Seok ; Lee, Young-Chul ; Ahn, Jee-Hyuk ; Jung, Seung-Boo
Author_Institution
Sch. of Adv. Mater. Sci. & Eng., Sungkyunkwan Univ., Suwon, South Korea
fYear
2010
fDate
12-15 Oct. 2010
Firstpage
306
Lastpage
309
Abstract
We evaluated the flexibility of screen-printed silver (Ag) circuits under various sintering temperatures. The circuits were built on a polyimide (PI) film by a screen printing technique using Ag nanopaste (73 wt%, 24 nm in diameter, Ag nanoparticles). The sintering temperature was raised from 150 to 300°C while the sintering time was fixed at 30 min. The flexibility was measured by two different kinds of methods; Massachussets Institute of Technology (MIT) type folding endurance test, and Institute for Interconnecting and Packaging Electronic Circuits (IPC) flexural resistance endurance test. In order to measure the flexibility of Ag circuits under various sintering temperatures, the changes of electrical resistance were observed while the printed Ag circuits were being folded or slid. The circuits sintered at higher temperatures needed more sliding and folding cycles to reach the critical point: while the sintering temperature increased from 150°C to 300°C, the flexibility decreased by around 90 % and 75 % after the IPC sliding process, and MIT folding process, respectively. The results showed that the flexibility of printed circuits was affected by the microstructural changes depending on the sintering temperature.
Keywords
heat treatment; polymer films; printed circuit testing; silver; sintering; Ag; IPC flexural resistance endurance test; Institute for Interconnecting and Packaging Electronic Circuits; MIT folding process; MIT type folding endurance test; Massachussets Institute of Technology; electrical resistance; heat treatment effect; polyimide film; printed circuit flexibility; silver nanopaste circuit screen-printing; sintering temperatures; temperature 150 degC to 300 degC; time 30 min; Films; Nanoparticles; Printed circuits; Printing; Resistance; Substrates; Temperature measurement; Ag nanopaste; Flexibility; IPC flexural resistance endurance test; MIT folding endurance test; Sintering temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanotechnology Materials and Devices Conference (NMDC), 2010 IEEE
Conference_Location
Monterey, CA
Print_ISBN
978-1-4244-8896-4
Type
conf
DOI
10.1109/NMDC.2010.5652445
Filename
5652445
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