DocumentCode :
3350504
Title :
Near field experiments and theoretical modeling on visible photonic bandgap structures
Author :
Yarrison-Rice, J.M. ; Swarup, P. ; Rice, P.R. ; Sharma, Ashok ; Jackson, Howard E. ; Naghski, D. ; Boyd, J.T. ; Charlton, M.D.B. ; Parker, Gregory J.
Author_Institution :
Dept. of Phys., Miami Univ., Oxford, OH, USA
fYear :
1992
fDate :
23-28 May 1992
Firstpage :
215
Lastpage :
216
Abstract :
Summary form only give. We have obtained preliminary theoretical and experimental results on a visible photonic band gap (PBG) structures which consists of 20 rows of 146 nm air pores arranged in a triangular lattice with pitch of 260 nm etched into the center of a planar waveguide. The waveguide has a thermally grown 1.8 /spl mu/m thick silicon dioxide substrate buffer, followed by 250 nm thick silicon nitride waveguiding layer and a thin 75 nm silicon dioxide cladding layer. Near field scanning optical microscopy (NSOM) is employed to probe the PBG structures. NSOM achieves its subdiffraction spatial resolution by scanning an aperture of /spl sim/100 nm at a distance of /spl sim/10 nm above the surface of interest; thus NSOM can provide details of local photon density of states and mode structure as light propagates through both the planar region and PBG stripe.
Keywords :
near-field scanning optical microscopy; photonic band gap; 1.8 mum; 146 nm; 260 nm; local photon density of states; mode structure; near field; near field scanning optical microscopy; planar waveguide; visible photonic band gap structure; Etching; Lattices; Optical buffering; Optical microscopy; Optical planar waveguides; Optical waveguide theory; Optical waveguides; Photonic band gap; Planar waveguides; Silicon compounds;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quantum Electronics and Laser Science Conference, 1999. QELS '99. Technical Digest. Summaries of Papers Presented at the
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
1-55752-576-X
Type :
conf
DOI :
10.1109/QELS.1999.807559
Filename :
807559
Link To Document :
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