Title :
THz-emission from photoexcited semiconductor superlattices with applied ac and dc electric fields
Author :
Meier, T. ; Thomas, Paul ; Koch, S.W.
Author_Institution :
Dept. of Phys., Philipps-Univ., Marburg, Germany
Abstract :
Summary form only given. The numerical investigations are based on a microscopic many-body theory which allows one to compute the linear and nonlinear optical properties of semiconductor superlattices in the presence of homogeneous electric fields applied in the growth direction. The THz-emission due to the field-driven dynamics of photoexcited carriers is investigated for the combined action of static and alternating fields. For a driving field it was shown within a simple model that the equations governing the intraband dynamics in the field-driven superlattice should be analogous to the ones describing the superconducting Josephson junction. The transport properties in this regime can be described by the picture of multi-photon-assisted tunneling between Wannier-Stark states.
Keywords :
high-speed optical techniques; micro-optics; micromechanical resonators; microwave measurement; optical resonators; polaritons; semiconductor superlattices; submillimetre wave generation; THz-emission; Wannier-Stark states; applied ac electric fields; dc electric fields; field-driven dynamics; field-driven superlattice; growth direction; homogeneous electric fields; linear optical properties; microscopic many-body theory; multi-photon-assisted tunneling; nonlinear optical properties; numerical investigations; photoexcited carriers; photoexcited semiconductor superlattices; superconducting Josephson junction; Antenna measurements; Delay; Electric fields; Excitons; Laser excitation; Nonlinear optics; Optical superlattices; Resonance; Semiconductor superlattices; Wavelength measurement;
Conference_Titel :
Quantum Electronics and Laser Science Conference, 1999. QELS '99. Technical Digest. Summaries of Papers Presented at the
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
1-55752-576-X
DOI :
10.1109/QELS.1999.807564