Title :
Design considerations for Cross Check foundations and libraries
Author :
Fertsch, Michael T. ; Lee, Shu H. ; Rioux, James ; Sweetland, Karl B. ; Watrous, James E. ; Bompastore, Paul N.
Author_Institution :
Adv. Device Center, Raytheon Co., Andover, MA, USA
Abstract :
CrossCheck built-in test techniques require special structures in Sea-of-Gates foundations and cell personalizations. This paper discusses the performance and area impacts these structures make to gate-array chips and cell libraries. Results from fabricated CrossCheck devices are presented
Keywords :
application specific integrated circuits; built-in self test; integrated circuit testing; logic arrays; logic testing; ASIC testing; CrossCheck built-in test techniques; cell libraries; cell personalizations; design considerations; gate-array chips; sea of gates foundations; Built-in self-test; Circuit faults; Circuit testing; Electronic equipment testing; Hardware; Libraries; Manufacturing; Monitoring; Probes; Test pattern generators;
Conference_Titel :
ASIC Conference and Exhibit, 1991. Proceedings., Fourth Annual IEEE International
Conference_Location :
Rochester, NY
Print_ISBN :
0-7803-0101-3
DOI :
10.1109/ASIC.1991.242911
