• DocumentCode
    3350615
  • Title

    THz emission of coherent plasmons in semiconductor superlattices

  • Author

    Bratschitsch, R. ; Kersting, R. ; Strasser, G. ; Unterrainer, K. ; Fischler, W. ; Hopfel, R.A.

  • Author_Institution
    Inst. for Solid State Electron., Tech. Univ. Wien, Austria
  • fYear
    1992
  • fDate
    23-28 May 1992
  • Firstpage
    221
  • Abstract
    Summary form only given. Ultrafast excitation of n-doped GaAs layers leads to THz emission from coherent plasma oscillations. The emission frequency of this THz source is given by the simple plasma frequency formula /spl omega//sub p/=(ne/sup 2//m*/spl epsiv/)/sup 1/2/ where n is the number of extrinsic electrons which are confined between the surface depletion field and the GaAs substrate. The desired frequency can be controlled by changing the number of electrons n via the doping concentration of the material. Another possibility to determine the emission frequency /spl omega//sub p/ is to change the effective mass m* of the electrons. This can be accomplished by placing the electrons in the periodic potential of a superlattice.
  • Keywords
    III-V semiconductors; aluminium compounds; gallium arsenide; semiconductor superlattices; surface plasmons; time resolved spectra; GaAs-AlGaAs; THz emission; coherent plasma oscillations; coherent plasmons; n-doped layers; periodic potential; semiconductor superlattices; surface depletion field; ultrafast excitation; Doping; Effective mass; Electron emission; Frequency; Gallium arsenide; Plasma confinement; Plasma sources; Plasmons; Semiconductor superlattices; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quantum Electronics and Laser Science Conference, 1999. QELS '99. Technical Digest. Summaries of Papers Presented at the
  • Conference_Location
    Baltimore, MD, USA
  • Print_ISBN
    1-55752-576-X
  • Type

    conf

  • DOI
    10.1109/QELS.1999.807567
  • Filename
    807567