Title :
Testing of imbedded memories in ASICs
Author :
Mulherkar, Shashi
Author_Institution :
Northern Telecom Ltd., Brampton, Ont., Canada
Abstract :
The testing of imbedded memories in ASICs is becoming increasingly difficult due to the large size of memories which ASIC vendors offer. This paper illustrates an algorithm which was developed and successfully implemented on the LTX Trillium Micromaster tester
Keywords :
SRAM chips; application specific integrated circuits; circuit analysis computing; integrated circuit testing; logic testing; ASICs; LTX Trillium Micromaster tester; SRAM; algorithm; imbedded memories; testing; Algorithms; Amplitude shift keying; Application specific integrated circuits; Built-in self-test; Circuit faults; Circuit testing; Intelligent networks; Random access memory; Registers; Telecommunications;
Conference_Titel :
ASIC Conference and Exhibit, 1991. Proceedings., Fourth Annual IEEE International
Conference_Location :
Rochester, NY
Print_ISBN :
0-7803-0101-3
DOI :
10.1109/ASIC.1991.242913
