Title :
Ceramic slurry concentration measurement based on the theory of particle backscattering
Author :
Ma, Lixiu ; Sheng, Cuixia ; Li, Tianze
Author_Institution :
Sch. of Electr. & Electron. Eng., Shandong Univ. of Technol., Zibo, China
Abstract :
For the present, the concentration of ceramic slurry is measured using the traditional physical method. The measuring accuracy of this method is not high and the efficiency is low. In order to measure the concentration of ceramic slurry quickly and easily, a new type of detection equipment need to be developed. Based on Mie scattering theory, the integral formula of total reflecting light intensity is deduced. It proves that to using scattering methods to measure the concentration of ceramic slurry is feasible. In the experiment, an optical fiber of double-D Optical Fiber Sensor made the 650 nm wavelength red laser light directly enter the ceramic slurry. Another optical fiber received the scattering laser light coming from the ceramic particles, and absorbed the light into the photosensitive element. By processing the signal of the Optical Fiber Sensor using the circuit designed, the Voltage value can be obtained. By measuring some ceramic slurry samples separately whose clay content varied from 0 percent to 60 percents, a set of data is got. After this set of data being analyzed it can be known that the data curve is nonlinear when ceramic slurry content is from 0 percent to 60 percents. It is linear when the content of ceramic slurry is from 55 percents to 60 percents. Based on the results of this experiment, a ceramic slurry concentration detection device was developed.
Keywords :
Mie scattering; ceramic industry; fibre optic sensors; particle backscattering; signal processing; slurries; Mie scattering theory; ceramic particles; ceramic slurry concentration detection device; ceramic slurry concentration measurement; detection equipment; double-D optical fiber sensor; integral formula; particle backscattering; photosensitive element; physical method; scattering laser light; scattering method; signal processing; total reflecting light intensity; voltage value; Backscatter; Ceramics; Light scattering; Mie scattering; Optical fibers; Optical scattering; Particle measurements; Particle scattering; Slurries; Wavelength measurement; 650nm laser signal; Mie scattering theory; data processing; detected position;
Conference_Titel :
Mechanic Automation and Control Engineering (MACE), 2010 International Conference on
Conference_Location :
Wuhan
Print_ISBN :
978-1-4244-7737-1
DOI :
10.1109/MACE.2010.5535690