• DocumentCode
    3350801
  • Title

    Curvelet analysis of kymograph for tracking bi-directional particles in fluorescence microscopy images

  • Author

    Chenouard, Nicolas ; Buisson, Johanna ; Bloch, Isabelle ; Bastin, Philippe ; Olivo-Marin, Jean-Christophe

  • Author_Institution
    Unite d´´Analyse d´´Images Quantitative, Inst. Pasteur, Paris, France
  • fYear
    2010
  • fDate
    26-29 Sept. 2010
  • Firstpage
    3657
  • Lastpage
    3660
  • Abstract
    In this paper we present a new procedure for tracking bi-directional objects in kymographs. The proposed technique is based on a novel adaptive and directional band-pass filtering method which allows us to separate particles which move in opposite directions. The filtering method exploits the curvelet analysis of the kymograph image to automatically adapt to the objects trails characteristics and select oriented features. The separation of bi-directional objects in separated images allows us to reliably detect and track fluorescent particles in fluorescence image sequences, despite numerous crossroad points in the kymograph space. The new abilities provided by the proposed technique are highlighted by the analysis of biological images which were previously impossible to analyze reliably.
  • Keywords
    adaptive filters; band-pass filters; curvelet transforms; diagnostic radiography; fluorescence spectroscopy; image sequences; medical image processing; object tracking; adaptive band-pass filtering; bidirectional object tracking; bidirectional particle tracking; biological image; curvelet analysis; directional band-pass filtering; fluorescence image sequence; fluorescence microscopy image; fluorescent particle; kymograph image; object trail characteristics; Band pass filters; Bidirectional control; Biology; Microscopy; Tracking; Trajectory; Transforms; Curvelet transform; Kymograph; Multiple Hypothesis Tracking (MHT); Particle tracking;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Processing (ICIP), 2010 17th IEEE International Conference on
  • Conference_Location
    Hong Kong
  • ISSN
    1522-4880
  • Print_ISBN
    978-1-4244-7992-4
  • Electronic_ISBN
    1522-4880
  • Type

    conf

  • DOI
    10.1109/ICIP.2010.5652479
  • Filename
    5652479