Title :
Using optimization in circuit design to improve the yield and circuit performance
Author :
Doganis, Kyriakos ; Linardes, Panos
Author_Institution :
Electrical Engineering Software Inc., Santa Clara, CA, USA
Abstract :
Circuit simulation, circuit optimization, sensitivity analysis and yield analysis and optimization tools are integrated in the OPSIM system and support a design methodology that improves designer productivity, circuit performance, manufacturing yield and longterm reliability in ICs. Values for circuit parameters are automatically determined to meet a target performance while accounting for process extremes and environmental conditions
Keywords :
application specific integrated circuits; circuit CAD; circuit analysis computing; design engineering; linear integrated circuits; optimisation; reliability; sensitivity analysis; ASIC; OPSIM system; circuit design optimisation; circuit optimization; circuit performance; design methodology; designer productivity; longterm reliability; manufacturing yield; optimization tools; sensitivity analysis; yield analysis; Circuit optimization; Circuit simulation; Circuit synthesis; Design methodology; Design optimization; Integrated circuit manufacture; Integrated circuit yield; Performance analysis; Productivity; Sensitivity analysis;
Conference_Titel :
ASIC Conference and Exhibit, 1991. Proceedings., Fourth Annual IEEE International
Conference_Location :
Rochester, NY
Print_ISBN :
0-7803-0101-3
DOI :
10.1109/ASIC.1991.242935
