Title :
The application of differential logic to test vector generation for diagnosis
Author :
Porter, Gilbert B., III
Author_Institution :
GE Corp. Res. & Dev. Center, Schenectady, NY, USA
Abstract :
The author describes the use of differential logic as a theoretical basis for test vector generation for the diagnosis of digital logic. In particular, he focuses on methods of formulating test requirements into a set of equations which can either be solved to obtain test vector solutions or can provide constraints for the solution search in underconstrained cases. The method is based on a formalism called differential logic. The theory for differential logic was developed in modeling behavior and detection of the variation due to changes in parameters or structures during the process of analogical reasoning
Keywords :
formal logic; knowledge engineering; analogical reasoning; constraints; diagnosis; differential logic; digital logic; equations; modeling behavior; parameters; solution search; structures; test requirements; test vector generation; test vector solutions; underconstrained cases; Automatic logic units; Automatic testing; Circuit testing; Differential equations; Logic testing; Mathematics; Optimization methods; Research and development; Rivers; System testing;
Conference_Titel :
Artificial Intelligence for Industrial Applications, 1988. IEEE AI '88., Proceedings of the International Workshop on
Conference_Location :
Hitachi City
DOI :
10.1109/AIIA.1988.13279