DocumentCode
3350957
Title
The application of differential logic to test vector generation for diagnosis
Author
Porter, Gilbert B., III
Author_Institution
GE Corp. Res. & Dev. Center, Schenectady, NY, USA
fYear
1988
fDate
25-27 May 1988
Firstpage
115
Lastpage
117
Abstract
The author describes the use of differential logic as a theoretical basis for test vector generation for the diagnosis of digital logic. In particular, he focuses on methods of formulating test requirements into a set of equations which can either be solved to obtain test vector solutions or can provide constraints for the solution search in underconstrained cases. The method is based on a formalism called differential logic. The theory for differential logic was developed in modeling behavior and detection of the variation due to changes in parameters or structures during the process of analogical reasoning
Keywords
formal logic; knowledge engineering; analogical reasoning; constraints; diagnosis; differential logic; digital logic; equations; modeling behavior; parameters; solution search; structures; test requirements; test vector generation; test vector solutions; underconstrained cases; Automatic logic units; Automatic testing; Circuit testing; Differential equations; Logic testing; Mathematics; Optimization methods; Research and development; Rivers; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Artificial Intelligence for Industrial Applications, 1988. IEEE AI '88., Proceedings of the International Workshop on
Conference_Location
Hitachi City
Type
conf
DOI
10.1109/AIIA.1988.13279
Filename
13279
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