Title :
Ultrafast structural dynamics in InSb measured using time resolved X-ray diffraction
Author :
Lindenberg, Aaron M. ; Kang, I. ; Johnson, Stanley ; Falcone, R.W. ; Heimann, P.A. ; Padmore, H.A. ; Missalla, T. ; Lee ; Chang, Zhe ; Murnane, Margaret M. ; Kapteyn, Henry C. ; Wark
Author_Institution :
Dept. of Phys., California Univ., Berkeley, CA, USA
Abstract :
Summary form only given. Ultrafast structural changes in molecules and solids have only recently begun to be directly probed with X-ray sources. For example, conformational changes in proteins, the breaking of chemical bonds, and laser-induced phase transitions in solids may all be studied on an atomic length scale using the method of X-ray diffraction. In the report, we study laser-induced changes in the long range order of the semiconductor InSb.
Keywords :
III-V semiconductors; X-ray diffraction; high-speed optical techniques; indium compounds; laser beam effects; long-range order; solid-state phase transformations; 1 kHz; 150 fs; 2.5 mJ; 5 ps; InSb; X-ray diffraction; X-ray sources; atomic length scale; chemical bonds; conformational changes; laser-induced changes; laser-induced phase transitions; long range order; molecules; proteins; semiconductor; solids; time resolved X-ray diffraction; ultrafast structural changes; ultrafast structural dynamics; Atom lasers; Atomic beams; Atomic measurements; Chemical lasers; Laser transitions; Proteins; Semiconductor lasers; Solid lasers; Time measurement; X-ray lasers;
Conference_Titel :
Quantum Electronics and Laser Science Conference, 1999. QELS '99. Technical Digest. Summaries of Papers Presented at the
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
1-55752-576-X
DOI :
10.1109/QELS.1999.807594
