Title :
Frequency domain interferometric second harmonic spectroscopy of a Si MOS structure
Author :
Wilson, P.T. ; Downer, M.C. ; Aktsipetrov, O.A. ; Mishina, E.D.
Author_Institution :
Dept. of Phys., Texas Univ., Austin, TX, USA
Abstract :
Summary form only given. Because of their high peak intensity, femtosecond laser pulses have been exploited extensively to generate reflected SH radiation with unprecedented efficiency from weakly nonlinear interfaces such as Si(OOl).´ In this paper, we show that the broad bandwidth and coherence of such pulses also enable a powerful technique for measuring the spectrum and phase of the SH radiation across the bandwidth of a 15 fs TkSapphire laser pulse without tuning the laser.
Keywords :
MIS structures; elemental semiconductors; high-speed optical techniques; light interferometry; optical harmonic generation; silicon; Si; Si MOS structure; critical point resonance; femtosecond laser pulse; frequency domain interferometric second harmonic spectroscopy; nonlinear interface; Bandwidth; Frequency domain analysis; Laser tuning; Optical pulse generation; Optical pulses; Phase measurement; Power lasers; Pulse measurements; Resonance; Spectroscopy;
Conference_Titel :
Quantum Electronics and Laser Science Conference, 1999. QELS '99. Technical Digest. Summaries of Papers Presented at the
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
1-55752-576-X
DOI :
10.1109/QELS.1999.807622
