• DocumentCode
    3351380
  • Title

    Temperature dependence of lasing characteristics for 1.3 /spl mu/m GaAs-based quantum dot lasers

  • Author

    Huffaker, D.L. ; Shchekin, O. ; Park, Gi-Ho ; Zou, Z.Z. ; Deppe, Dennis G.

  • Author_Institution
    Microelectron. Res. Center, Texas Univ., Austin, TX, USA
  • fYear
    1992
  • fDate
    23-28 May 1992
  • Firstpage
    253
  • Lastpage
    254
  • Abstract
    Summary form only given. Recently ground-state 1.3 /spl mu/m wavelength lasing has been demonstrated at room temperature from GaAs-based uncoated heterostructure lasers using an InGaAs quantum dot (QD) active region. Despite low threshold current density at 77 K, lasing at the higher temperatures shows a rapid increase in threshold occurring above 200 K. In this talk we present data characterizing the QD laser´s threshold temperature dependence, and show that it comes mainly from nonradiative recombination from the QD higher energy levels and wetting layer. The results suggest that very low threshold current density can be obtained at room temperature once nonradiative recombination is eliminated.
  • Keywords
    III-V semiconductors; current density; gallium arsenide; nonradiative transitions; quantum well lasers; semiconductor quantum dots; 1.3 micron; GaAs; GaAs-based quantum dot lasers; InGaAs; InGaAs quantum dot active region; ground-state lasing; lasing characteristics; nonradiative recombination; room temperature; temperature dependence; uncoated heterostructure lasers; very low threshold current density; Laser theory; Lattices; Photonic band gap; Photonic crystals; Quantum dot lasers; Spontaneous emission; Surface emitting lasers; Temperature dependence; US Department of Transportation; Vertical cavity surface emitting lasers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quantum Electronics and Laser Science Conference, 1999. QELS '99. Technical Digest. Summaries of Papers Presented at the
  • Conference_Location
    Baltimore, MD, USA
  • Print_ISBN
    1-55752-576-X
  • Type

    conf

  • DOI
    10.1109/QELS.1999.807634
  • Filename
    807634