Title :
A maximum entropy model for product feature extraction in online customer reviews
Author :
Somprasertsri, Gamgarn ; Lalitrojwong, Pattarachai
Author_Institution :
Fac. of Inf. Technol., King Mongkut´´s Inst. of Technol. Ladkrabang, Bangkok
Abstract :
Product feature extraction is an important task of review mining and summarization. The task of product feature extraction is to find product features that customers refer to in their topic reviews. It would be useful to characterize the opinions which they review or express about the products. In this paper, we propose an approach to product feature extraction using a maximum entropy model. Maximum entropy is a probability distribution estimation technique. It is widely used for classification problems in natural language processing, such as question answering, information extraction, and part-of-speech tagging. The underlying principle of maximum entropy is that without external knowledge, one should prefer distributions that are uniform. Using a maximum entropy approach, at first we extract features from the corpus, train maximum entropy model with an annotated corpus, and then use it with additional product feature discovery to extract product features from customer reviews. Our experimental results show that this approach can work effectively for product feature extraction with 71.88% precision and 75.23% recall.
Keywords :
data mining; electronic commerce; maximum entropy methods; natural language processing; pattern classification; probability; classification problems; information extraction; maximum entropy model; natural language processing; online customer reviews; part-of-speech tagging; probability distribution estimation technique; product feature extraction; Data mining; Entropy; Feature extraction; Information technology; Manufacturing; Motion pictures; Natural language processing; Probability distribution; Tagging; Visualization; maximum entropy model; product feature extraction; review mining and summarization; text mining;
Conference_Titel :
Cybernetics and Intelligent Systems, 2008 IEEE Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-1673-8
Electronic_ISBN :
978-1-4244-1674-5
DOI :
10.1109/ICCIS.2008.4670882