DocumentCode :
3351628
Title :
Neutron imaging with micrometric spatial resolution
Author :
Vavrik, D. ; Jakubek, J. ; Pospisil, S. ; Vacik, J.
Author_Institution :
Inst. of Theor. & Appl. Mech., Prague, Czech Republic
fYear :
2011
fDate :
23-29 Oct. 2011
Firstpage :
1285
Lastpage :
1289
Abstract :
The detection of neutrons with high spatial resolution by a pixelated silicon semiconductor silicon detector requires the use of a thin converter. A 6Li based converter was used for this purpose in our work. We demonstrate that unwanted gamma rays and electrons accompanying neutron beam can be effectively suppressed using pattern recognition of the analyzed particle tracks, where spectroscopic ability of the detector was advantageously used. Neutron detection with micrometric spatial resolution is reached by appropriate fitting of identified heavy charged particles by the Gaussian distribution.
Keywords :
Gaussian distribution; neutron detection; neutron-nucleus reactions; pattern recognition; semiconductor counters; 6Li based converter; 6Li(n,α)3H; Gaussian distribution; electron suppression; gamma-ray suppression; heavy charged particles; high spatial resolution neutron detection; micrometric spatial resolution; neutron imaging; particle track pattern recognition; pixelated silicon semiconductor detector; thin converter; Image quality;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2011 IEEE
Conference_Location :
Valencia
ISSN :
1082-3654
Print_ISBN :
978-1-4673-0118-3
Type :
conf
DOI :
10.1109/NSSMIC.2011.6154327
Filename :
6154327
Link To Document :
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