Title :
Single-electron memory based on floating-gated carbon nanotube field-effect transistors
Author :
Ohori, Takahiro ; Ohno, Yasuhide ; Maehashi, Kenzo ; Inoue, Koichi ; Matsumoto, Kazuhiko
Author_Institution :
Inst. of Sci. & Ind. Res., Osaka Univ., Osaka, Japan
Abstract :
We have fabricated floating-gated carbon nanotube field-effect transistors (CNTFETs). Au floating dots in the device are expected to act as charge storage nodes. The fabricated floating-gated CNTFETs clearly exhibited memory effect. Furthermore, single-electron memory was demonstrated based on floating-gated CNTFETs. Quantized shifts in the threshold voltage as a function of charging voltage and retention time were clearly observed. The quantized characteristics are attributed to the effect of single hole charging in the Au floating dots.
Keywords :
carbon nanotubes; digital storage; field effect transistors; gold; nanotube devices; single electron devices; Au; C; CNTFET; charge storage nodes; floating dots; floating-gated carbon nanotube field-effect transistors; retention time; single-electron memory; threshold voltage; CNTFETs; Carbon nanotubes; Gold; Logic gates; Nonvolatile memory; Single electron memory; Threshold voltage;
Conference_Titel :
Nanotechnology Materials and Devices Conference (NMDC), 2010 IEEE
Conference_Location :
Monterey, CA
Print_ISBN :
978-1-4244-8896-4
DOI :
10.1109/NMDC.2010.5652573