DocumentCode
3352070
Title
Redundancy - it´s not just for defects any more
Author
Aitken, Rob
Author_Institution
Artisan Components, Sunnyvale, CA, USA
fYear
2004
fDate
9-10 Aug. 2004
Firstpage
117
Lastpage
120
Abstract
This paper shows how process variation affects memory margin and performance, and shows that in some cases additional redundancy capability can be used to recover yield due to process variation in addition to yield recovery for defects.
Keywords
integrated circuit yield; integrated memory circuits; redundancy; defects; memory margin; process variation; redundancy; yield recovery; Circuits; Clocks; Logic; Manufacturing; Measurement; Memory architecture; Process design; Signal design; Stress; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Memory Technology, Design and Testing, 2004. Records of the 2004 International Workshop on
ISSN
1087-4852
Print_ISBN
0-7695-2193-2
Type
conf
DOI
10.1109/MTDT.2004.1327994
Filename
1327994
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