Fast, low-noise, low-power electronics for the analog readout of non-linear DEPFET pixels

A high speed focal plane system and a novel non linear DEPFET detector are under development to comply with the European X-ray Free Electron Laser (XFEL) requirements. The facility is under construction in the Hamburg area (Germany) and will be able to deliver ultra short, high intensity X-ray pulses 220ns apart and grouped in macro bunches with a repetition rate of 10Hz. DEPFETs have been chosen since they can provide excellent energy resolution and high speed readout. Full parallel readout is required, with every channel comprising analog filtering, data conversion and memory storage. Here we present results for the first prototype of the analog front end stage, that implements a current readout approach. The circuit is based on the Flip Capacitor Filter technique and was realized in 130nm 1.2V CMOS technology from IBM.