Effects of fat resistivity changes on measurement sensitivity of impedance cardiography determined by a 3D finite element model of the Visible Human Man

Author

Kauppinen, Pasi K. ; Hyttinen, Jari A. ; Malmivuo, Jaakko A.

Author_Institution

Ragnar Granit Inst., Tampere Univ. of Technol., Finland

Volume

5

fYear

1996

fDate

31 Oct-3 Nov 1996

Firstpage

1936

Abstract

A detailed three-dimensional physiologically accurate computer thorax model based on finite difference element method (FDEM) is developed using the National Library of Medicine´s (NLM) Visible Human Man (VHM) data for calculation of the measurement sensitivity of conventional impedance cardiography (ICG). The effect of the body and heart fat resistivity changes on measurement sensitivity and signal formation are determined based on the reciprocity theorem and lead field analysis. The results obtained show that the sensitivity of ICG to measure conductivity changes in the region of the heart and large arteries and veins changes considerably with different fat resistivity values. The results also show that the basal impedance values lie within the normal range with different fat resistivities

Keywords

bioelectric phenomena; biomedical measurement; digital simulation; electric impedance measurement; finite difference methods; finite element analysis; medical diagnostic computing; physiological models; 3D finite element model; National Library of Medicine; Visible Human Man; basal impedance values; body fat; detailed three-dimensional physiologically accurate computer thorax model; fat resistivity changes effects; heart fat; impedance cardiography; measurement sensitivity; signal formation; Biological system modeling; Cardiography; Conductivity; Finite difference methods; Heart; Humans; Impedance measurement; Libraries; Signal analysis; Thorax;

fLanguage

English

Publisher

ieee

Conference_Titel

Engineering in Medicine and Biology Society, 1996. Bridging Disciplines for Biomedicine. Proceedings of the 18th Annual International Conference of the IEEE

Conference_Location

Amsterdam

Print_ISBN

0-7803-3811-1

Type

conf

DOI

10.1109/IEMBS.1996.646328

Filename

646328