Title :
“CUBE”, A low-noise CMOS preamplifier as alternative to JFET front-end for high-count rate spectroscopy
Author :
Bombelli, L. ; Fiorini, C. ; Frizzi, T. ; Alberti, R. ; Longoni, A.
Author_Institution :
Dipt. di Elettron. e Inf., Politec. di Milano, Milan, Italy
Abstract :
We present a monolithic CMOS charge preamplifier named “CUBE”. It is specifically designed to be used with Silicon Drift Detectors (SDD). We will show that the use a MOSFET as input transistor allows superior noise performances at very short shaping times respect to the state-of-the-art externally connected JFET devices. We will show the achievable energy resolutions using a 10mm2 reference SDD with different count-rates and with different analog and digital commercial filters. A state-of-the-art energy resolution (for a silicon detector) of 125 eV at 6 keV has been achieved with the optimum shaping time. Moreover, it will be shown that CUBE enables the use of an extremely fast-peaking time of only 100 ns with extraordinary good energy resolution of 149 eV. As a consequence we can state that, the CUBE preamplifier is very well suited for high count-rate spectroscopy applications. An example of the performance with output countrate up to 490 kcps will be reported.
Keywords :
CMOS integrated circuits; MOSFET circuits; drift chambers; junction gate field effect transistors; nuclear electronics; preamplifiers; silicon radiation detectors; CUBE; JΓET devices; JFET front-end device; MOSFET; analog commercial filter; digital commercial filter; energy resolution; fast-peaking time; high count-rate spectroscopy; high-count rate spectroscopy; input transistor; low-noise CMOS preamplifier; monolithic CMOS charge preamplifier; optimum shaping time; silicon drift detector; state-of-the-art energy resolution; superior noise performance; CMOS integrated circuits; CMOS technology; Ions; JFETs; Single photon emission computed tomography; Spectroscopy;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2011 IEEE
Conference_Location :
Valencia
Print_ISBN :
978-1-4673-0118-3
DOI :
10.1109/NSSMIC.2011.6154396