• DocumentCode
    3353286
  • Title

    Development of the GridPix detector for dual phase noble gas time projection chambers

  • Author

    Alfonsi, M. ; van Bakel, N. ; Decowski, M.P. ; Hemink, G. ; van der Graaf, H. ; Schon, R.

  • Author_Institution
    Nikhef, Amsterdam, Netherlands
  • fYear
    2011
  • fDate
    23-29 Oct. 2011
  • Firstpage
    92
  • Lastpage
    98
  • Abstract
    GridPix is a gas-filled detector with an aluminum mesh stretched 50 μm above the Timepix CMOS pixel chip. This defines a high electric field where gas amplification occurs. A feasibility study is currently ongoing at Nikhef for the application of the GridPix technology as a charge sensitive device in a dual phase noble gas Time Projection Chamber (TPC), within the framework of the DARWIN dark matter design study. The application in dual phase argon or xenon TPCs implies several technological challenges, such as the survival of the device at cryogenic temperature as well as the operation in a pure noble gas atmosphere without discharges. The equipment for tests at liquid nitrogen temperature and a gain measurement station have been built at Nikhef and the results are reported. Moreover, the first test of the device in a dual phase argon TPC has been performed in collaboration with ETH Zurich.
  • Keywords
    CMOS digital integrated circuits; argon; cryogenics; dark matter; gain measurement; nuclear electronics; semiconductor counters; time projection chambers; xenon; DARWIN dark matter design study; GridPix detector; GridPix technology; Timepix CMOS pixel chip; aluminum mesh; charge sensitive device; cryogenic temperature; dual phase argon TPC; dual phase noble gas; dual phase xenon TPC; electric field; gain measurement station; gas amplification; gas-filled detector; liquid nitrogen temperature; pure noble gas atmosphere; time projection chambers; wavelength 50 mum; Argon; Detectors; Ions;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2011 IEEE
  • Conference_Location
    Valencia
  • ISSN
    1082-3654
  • Print_ISBN
    978-1-4673-0118-3
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2011.6154446
  • Filename
    6154446