DocumentCode
3353299
Title
Spectrometric performances of monocrystalline artificial diamond detectors operated at high temperature
Author
Angelone, M. ; Fonnesu, N. ; Pillon, M. ; Prestopino, G. ; Sarto, F. ; Milani, E. ; Marinelli, Marco ; Verona, C. ; Verona-Rinati, G.
Author_Institution
Assoc. Euratom-ENEA sulla fusione, ENEA C.R. Frascati, Frascati, Italy
fYear
2011
fDate
23-29 Oct. 2011
Firstpage
2188
Lastpage
2191
Abstract
This paper reports about the influence of working temperature on the spectrometric and time dependent performances of single crystal diamond detectors (SCD) operating at temperature up to 200°C and irradiated with alpha particles. Two different types of SCD detectors were studied: a) SCD of commercial type; b) SCD produced at Rome “Tor Vergata” University and characterised by a layered structure. The first measurement of the response functions vs. temperature of the commercial SCD detector irradiated with 14 MeV neutrons and heated up to 140°C is also reported. The measurements pointed out the superior performances of diamond respect to other detectors (e.g. silicon) when operated at high temperature, however the present work also pointed out that a diamond detector assembled to operate at room temperature can suffer of mechanical and electrical stress. The results indicate that with a proper design diamond detectors can be suitable for operation at high temperature.
Keywords
alpha-particle effects; alpha-particle spectroscopy; diamond; neutron effects; neutron spectroscopy; semiconductor counters; C; alpha particle irradiation; commercial type SCD; electron volt energy 14 MeV; high temperature operation; layered structure custom SCD; monocrystalline artificial diamond detectors; neutron irradiation; response functions; spectrometric performance; time dependent performance; working temperature effects; Contacts; Detectors; Diamond-like carbon; Neutrons; Plasma temperature; Temperature; Temperature measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2011 IEEE
Conference_Location
Valencia
ISSN
1082-3654
Print_ISBN
978-1-4673-0118-3
Type
conf
DOI
10.1109/NSSMIC.2011.6154447
Filename
6154447
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