• DocumentCode
    3353307
  • Title

    First principle investigation of CrSi2 with doping V

  • Author

    Wanjun Yan ; Shiyun Zhou ; Quan Xie ; Chunhong Zhang ; Zhongzheng Zhang

  • Author_Institution
    Phys. & Electron. Sci. Dept., Anshun Univ., Anshun, China
  • Volume
    4
  • fYear
    2011
  • fDate
    12-14 Aug. 2011
  • Firstpage
    1747
  • Lastpage
    1749
  • Abstract
    The geometrical structure and electronic structure of CrSi2 with doping V were investigated by using first principle based on the plane wave pseudo-potential theory. The calculation of band structure result shows that the band gap decreased from 0.35eV (pure CrSi2) to 0.25eV (V doped). The valence band and conduction band near the Fermi energy is mainly composed of 3d state electron of Cr and 3p state electron of Si for pure CrSi2. After doping V atom, the Fermi energy moved into the valence band, the valence band and conduction band near the Fermi energy is mainly composed of 3d state electron of Cr and impurity atom V, the conductive type changed into p type, improve the electrical conductivity. It shows that doping plays a very important role to change conductivity of materials.
  • Keywords
    APW calculations; Fermi level; ab initio calculations; chromium compounds; conduction bands; crystal structure; electrical conductivity; energy gap; pseudopotential methods; semiconductor materials; valence bands; vanadium; CrSi2:V; Fermi energy; band gap; band structure; conduction band; electrical conductivity; electronic structure; first principle investigation; geometrical structure; plane wave pseudopotential theory; valence band; Atomic layer deposition; Charge carrier processes; Conductivity; Doping; Silicon; Three dimensional displays; CrSi2; electronic structure; first principle; geometrical structure;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic and Mechanical Engineering and Information Technology (EMEIT), 2011 International Conference on
  • Conference_Location
    Harbin, Heilongjiang, China
  • Print_ISBN
    978-1-61284-087-1
  • Type

    conf

  • DOI
    10.1109/EMEIT.2011.6023006
  • Filename
    6023006