Title :
Transmission property of adhesive interconnect for high frequency applications
Author :
Kim, Jong-woong ; Lee, Young-Chul ; Ko, Jae-Hoon ; Nah, Wansoo ; Jung, Seung-Boo
Author_Institution :
Sch. of Adv. Mater. Sci. & Eng., Sungkyunkwan Univ., Suwon
Abstract :
The radio frequency (RF) and high frequency performance of the flip chip interconnects with anisotropic conductive film (ACF) and non-conductive film (NCF) was investigated by measuring the scattering parameters (S-parameters) of the flip chip modules. The effects of two chip materials, Si and gallium arsenide (GaAs), and of the metal pattern gap between the signal line and ground plane in the coplanar waveguide (CPW) on the RF performance of the flip chip module were also investigated. The transmission properties of the GaAs were markedly improved on those of the Si chip, which was not suitable for the measurement of the S-parameters of the flip chip interconnect. Extracted impedance parameters showed that the RF performance of the flip chip interconnect with NCF was slightly better than that of the interconnect with ACF, mainly due to the self inductance of the conductive particle surface and the mutual inductance between the conductive particles in the ACF interconnect.
Keywords :
S-parameters; anisotropic media; coplanar waveguides; flip-chip devices; gallium arsenide; integrated circuit interconnections; radiofrequency integrated circuits; silicon; GaAs; S-parameters measurement; Si; adhesive interconnect transmission property; anisotropic conductive film; conductive particle surface; coplanar waveguide; flip chip interconnects; metal pattern gap; mutual inductance; nonconductive film; scattering parameter measurement; Anisotropic conductive films; Conductivity measurement; Coplanar waveguides; Flip chip; Frequency measurement; Gallium arsenide; Inductance; Radio frequency; Scattering parameters; Semiconductor device measurement;
Conference_Titel :
Electronic Materials and Packaging, 2007. EMAP 2007. International Conference on
Conference_Location :
Daejeon
Print_ISBN :
978-1-4244-1909-8
Electronic_ISBN :
978-1-4244-1910-4
DOI :
10.1109/EMAP.2007.4510286