Title :
Anew physics model for the charged particle transport with Geant4
Author :
Mendoza, Emilio ; Sansaloni, Francesc ; Arce, Pedro ; Cano-Ott, Daniel ; Lagares, Juan Ignacio
Author_Institution :
Dept. of Nucl. Innovation, CIEMAT, Madrid, Spain
Abstract :
An accurate modeling of the interactions of charged particles (protons, 2H, 3H, 3He, α-particles...) with energies up to tenths of MeV is necessary for many physical problems and applications such as proton therapy or isotope production for medical imaging (e.g. 11C and 18F), activation calculations, accelerator shielding or material damage calculations. Most of the Monte Carlo simulation codes, and in particular the Geant4 simulation package, applied to these types of problems do rely on theoretical nuclear models rather than evaluated cross section data. It is well known that the validity of nuclear models used in Monte Carlo codes for describing the interaction of charged particles in the energy range up to tenths of MeV can be poor and lead to unacceptably large systematic uncertainties if the model parameters are not adjusted by comparison to experimental data. For this reason, we have developed the G4ParticleHP package for Geant4. The package allows simulating the interaction of charged particles interactions using evaluated nuclear data libraries for charged particles such as ENDF-B.VII or TENDL.
Keywords :
Monte Carlo methods; elementary particle interaction models; nuclear reactions and scattering; physics computing; ENDF-B.VII; G4ParticleHP package; Geant4 simulation package; Monte Carlo simulation codes; TENDL; accelerator shielding; activation calculations; charged particle interaction modelling; charged particle nuclear data libraries; charged particle transport physics model; experimenal cross section data; isotope production; material damage calculations; medical imaging; proton therapy; theoretical nuclear models; Data models; Isotopes; Libraries; Monte Carlo methods; Neutrons; Production; Protons;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2011 IEEE
Conference_Location :
Valencia
Print_ISBN :
978-1-4673-0118-3
DOI :
10.1109/NSSMIC.2011.6154457