DocumentCode :
3353715
Title :
Fabrication and characterization of Epoxy/BaTiO3 composite capacitor films for high frequency behaviors
Author :
Hyun, Jin-Gul ; Lee, Sangyong ; Paik, Kyung-Wook
Author_Institution :
Dept. of Mater. Sci. & Eng., Korea Adv. Inst. of Sci. & Technol., Daejeon
fYear :
2007
fDate :
19-22 Nov. 2007
Firstpage :
1
Lastpage :
8
Abstract :
Epoxy/BaTiO3 composite embedded capacitor films (ECFs) were newly designed for high dielectric constant and low tolerance (less than plusmn5%) embedded capacitor fabrication for organic substrates. In terms of material formulation, ECFs are composed of specially formulated epoxy resin and latent curing agent, and in terms of coating process, a comma roll coating method is used for uniform film thickness in large area. Dielectric properties of BaTiO3 (BT) & SrTiO3 (ST) composite ECF is measured MIM capacitors on 10times10 cm PCBs. For 12 um thickness and 50 vol.% BTO ECFs, dielectric constant of 39, dielectric loss of 0.017, capacitance density of 2.4 nF/cm2, and less than 10% tolerance were obtained. Dielectric constant of BT ECF is bigger than that of ST ECF, and it is due to difference of permittivity of BT and ST particles. Dielectric constant of BT & ST ECF in high frequency range (0.5~10 GHz) is measured using a cavity resonance method. In order to estimate dielectric constants at high frequency, the reflection coefficient is measured with a network analyzer. Dielectric constant is calculated by observing the frequencies of the resonant cavity modes. Although there was no dielectric relaxation observed at pure epoxy, for BT ECF, there is the dielectric relaxation at 5~9 GHz. It is mainly due to changing of polarization mode of BT powder itself. In contrast, there is no relaxation for ST ECF up to 10 GHz.
Keywords :
MIM devices; barium compounds; capacitors; composite materials; dielectric losses; dielectric relaxation; network analysers; permittivity; polymers; titanium compounds; BT powder polarization mode; Jk-BaTiO3; MIM capacitors; capacitance density; cavity resonance method; comma roll coating method; composite embedded capacitor film fabrication; dielectric loss; dielectric relaxation; epoxy resin; high dielectric constant; latent curing agent; network analyzer; organic substrates; reflection coefficient measurement; resonant cavity modes; Capacitors; Coatings; Dielectric constant; Dielectric losses; Dielectric measurements; Dielectric substrates; Fabrication; Frequency measurement; High-K gate dielectrics; Permittivity measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Materials and Packaging, 2007. EMAP 2007. International Conference on
Conference_Location :
Daejeon
Print_ISBN :
978-1-4244-1909-8
Electronic_ISBN :
978-1-4244-1910-4
Type :
conf
DOI :
10.1109/EMAP.2007.4510318
Filename :
4510318
Link To Document :
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