DocumentCode
3353733
Title
Backside Optical Detection Of Internal Gate Delays In Flip-chip Mounted Silicon VLSI Circuits
Author
Heinrich, H.K. ; Pakdaman, N. ; Kent, D. ; Cropp, L.
Author_Institution
IBM T.J. Watson Research Center
fYear
1990
fDate
4-9 Nov 1990
Firstpage
559
Lastpage
560
Keywords
Circuits; Current measurement; Optical detectors; Optical pulse compression; Probes; Propagation delay; Pulse measurements; Silicon; Stimulated emission; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics Society Annual Meeting, 1990. LEOS '90. Conference Proceedings., IEEE
Print_ISBN
0-87942-550-4
Type
conf
DOI
10.1109/LEOS.1990.690676
Filename
690676
Link To Document