Title :
Backside Optical Detection Of Internal Gate Delays In Flip-chip Mounted Silicon VLSI Circuits
Author :
Heinrich, H.K. ; Pakdaman, N. ; Kent, D. ; Cropp, L.
Author_Institution :
IBM T.J. Watson Research Center
Keywords :
Circuits; Current measurement; Optical detectors; Optical pulse compression; Probes; Propagation delay; Pulse measurements; Silicon; Stimulated emission; Very large scale integration;
Conference_Titel :
Lasers and Electro-Optics Society Annual Meeting, 1990. LEOS '90. Conference Proceedings., IEEE
Print_ISBN :
0-87942-550-4
DOI :
10.1109/LEOS.1990.690676
