• DocumentCode
    3353734
  • Title

    The research and development of smart distribution feeder terminal unit based on digital signal processor

  • Author

    Zhou Hong ; Deng Qijun ; Dan Wei ; Lu Jue

  • Author_Institution
    Dept. of Autom., Wuhan Univ., Wuhan, China
  • fYear
    2010
  • fDate
    26-28 June 2010
  • Firstpage
    3994
  • Lastpage
    3997
  • Abstract
    Feeder Automation used in the smart distributed network is a very efficiency measure and also the foundation of Distributed Automation System. So the research in this area can make our power supply reliable and quality. Traditional FTU has many bugs such as bad real-time performance, less control function and not enough data analysis ability. In this paper, introduces the chip of TMS320F2812 from TI company as its main controller and this DSP can matches the processing speed; it takes the AD7862 as its AD part to avoid the sampling phase errors; also in this paper RTL8019AS is adopted to implement the communication with TCP/IP protocol. The data collected is saved in the storage medium with the format of COMTARDE and sent to the host computer through serial port for graph drawing, and then FFT algorithm is used for analysis. The FTU designed in this paper has the features of high calculating speed, strong real-time quality and strong data-processing ability. It identified that design of DSP-based FTU is better, feasibility and practicability.
  • Keywords
    digital signal processing chips; fast Fourier transforms; power distribution reliability; power supply quality; transport protocols; AD7862; COMTARDE; DSP-based FTU; FFT algorithm; RTL8019AS; TMS320F2812; data analysis ability; data-processing ability; digital signal processor; distributed automation system; feeder automation; graph drawing; power supply reliability; sampling phase errors; smart distribution feeder terminal unit; Automatic control; Automation; Communication system control; Computer bugs; Data analysis; Digital signal processors; Power supplies; Power system reliability; Research and development; Semiconductor device measurement; DAS; DSP; FFT; FTU;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Mechanic Automation and Control Engineering (MACE), 2010 International Conference on
  • Conference_Location
    Wuhan
  • Print_ISBN
    978-1-4244-7737-1
  • Type

    conf

  • DOI
    10.1109/MACE.2010.5535910
  • Filename
    5535910