• DocumentCode
    3353744
  • Title

    Design of Test Pattern Databank for Functional Testing of LCD Panels

  • Author

    Chung, Sheng-Luen ; Chen, Wen-Yuan

  • Author_Institution
    Dept. of Electr. Eng., Nat. Taiwan Univ. of Sci. & Technol.
  • Volume
    4
  • fYear
    2006
  • fDate
    9-13 July 2006
  • Firstpage
    3002
  • Lastpage
    3007
  • Abstract
    To ensure the quality of a liquid crystal display (LCD) panel, extensive quality check in terms of different display patterns is performed after LCD production. Geared to LCD manufacturing facilities with several production lines, this paper presents an LCD testing solution of a server-based test pattern databank (TPD) and units of pattern generation system (PGS). TPD provides a GUI-based tool to facilitate editing and maintenance of test patterns, which are then downloaded to independent PGSs, each connected to LCD panels in a production line, for the pattern testing. Three issues related to the design of the proposed TPD are addressed. First, the definition of file formats used to characterize display patterns and timing parameters utilized for a complete test; second, the underlying graphical user interface (GUI) design of the TPD. Comparison to some existing solutions are also discussed to highlight the benefit of test pattern file consistency as well as cost effectiveness in the proposed TPD
  • Keywords
    design engineering; graphical user interfaces; liquid crystal displays; testing; GUI; LCD panels; LCD testing; display patterns; functional testing; graphical user interface; liquid crystal display panel; test pattern databank; timing parameters; Assembly; Crosstalk; Graphical user interfaces; Liquid crystal displays; Performance evaluation; Production; Quality control; System testing; Test pattern generators; Timing; Liquid crystal display (LCD); Test pattern; communication protocol; pattern generation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics, 2006 IEEE International Symposium on
  • Conference_Location
    Montreal, Que.
  • Print_ISBN
    1-4244-0496-7
  • Electronic_ISBN
    1-4244-0497-5
  • Type

    conf

  • DOI
    10.1109/ISIE.2006.296094
  • Filename
    4078870