DocumentCode :
3353744
Title :
Design of Test Pattern Databank for Functional Testing of LCD Panels
Author :
Chung, Sheng-Luen ; Chen, Wen-Yuan
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ. of Sci. & Technol.
Volume :
4
fYear :
2006
fDate :
9-13 July 2006
Firstpage :
3002
Lastpage :
3007
Abstract :
To ensure the quality of a liquid crystal display (LCD) panel, extensive quality check in terms of different display patterns is performed after LCD production. Geared to LCD manufacturing facilities with several production lines, this paper presents an LCD testing solution of a server-based test pattern databank (TPD) and units of pattern generation system (PGS). TPD provides a GUI-based tool to facilitate editing and maintenance of test patterns, which are then downloaded to independent PGSs, each connected to LCD panels in a production line, for the pattern testing. Three issues related to the design of the proposed TPD are addressed. First, the definition of file formats used to characterize display patterns and timing parameters utilized for a complete test; second, the underlying graphical user interface (GUI) design of the TPD. Comparison to some existing solutions are also discussed to highlight the benefit of test pattern file consistency as well as cost effectiveness in the proposed TPD
Keywords :
design engineering; graphical user interfaces; liquid crystal displays; testing; GUI; LCD panels; LCD testing; display patterns; functional testing; graphical user interface; liquid crystal display panel; test pattern databank; timing parameters; Assembly; Crosstalk; Graphical user interfaces; Liquid crystal displays; Performance evaluation; Production; Quality control; System testing; Test pattern generators; Timing; Liquid crystal display (LCD); Test pattern; communication protocol; pattern generation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics, 2006 IEEE International Symposium on
Conference_Location :
Montreal, Que.
Print_ISBN :
1-4244-0496-7
Electronic_ISBN :
1-4244-0497-5
Type :
conf
DOI :
10.1109/ISIE.2006.296094
Filename :
4078870
Link To Document :
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