• DocumentCode
    3353763
  • Title

    Use of LaBr3 for downhole spectroscopic applications

  • Author

    Stoller, C. ; Adolph, B. ; Berheide, M. ; Brill, T. ; Clevinger, P. ; Crary, S. ; Crowder, B. ; Fricke, S. ; Grau, J. ; Hackbart, M. ; Herron, S. ; Jorion, B. ; Lorente, M. ; Madio, D. ; Miles, J. ; Philip, O. ; Radtke, R.J. ; Roscoe, B. ; Shestakova, I.

  • Author_Institution
    Schlumberger Princeton Technol. Center, Princeton Junction, NJ, USA
  • fYear
    2011
  • fDate
    23-29 Oct. 2011
  • Firstpage
    191
  • Lastpage
    195
  • Abstract
    The use of lanthanum bromide (LaBr3) in commercial applications has increased rapidly over the last few years owing to its very favorable properties, e.g., excellent spectral resolution, high speed, high light output, and efficiency. In addition to these properties, the ability of LaBr3 to work at temperatures up to 200°C without a significant loss in performance is of particular interest to the well logging industry. The use of the new scintillator together with a 175-°C photomultiplier, a high throughput spectroscopy pulse-height analyzer, and a high-performance pulsed neutron generator allows new downhole gamma-ray spectroscopy measurements with unprecedented precision and accuracy. The instrument measures gamma-rays from both inelastic neutron interactions and neutron capture at logging speeds up to 18 m/min (3600 ft/h) resulting in a 0.5-s acquisition time for the typically used 15 cm (6-in) depth intervals.
  • Keywords
    gamma-ray spectroscopy; lanthanum compounds; photomultipliers; solid scintillation detectors; LaBr3; accuracy; downhole gamma-ray spectroscopy; high performance pulsed neutron generator; inelastic neutron interaction; lanthanum bromide; performance loss; photomultiplier; precision; pulse height analyzer; scintillator; temperature 175 degC; well logging; Generators; Lead; Minerals; Sensitivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2011 IEEE
  • Conference_Location
    Valencia
  • ISSN
    1082-3654
  • Print_ISBN
    978-1-4673-0118-3
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2011.6154477
  • Filename
    6154477