A translinear-based RF RMS detector for embedded test

Author

Yin, Qizhang ; Eisenstadt, William R. ; Fox, Robert M.

Author_Institution

Dept. of Electr. & Comput. Eng., Florida Univ., Gainesville, FL, USA

Volume

1

fYear

2004

fDate

23-26 May 2004

Abstract

A high-dynamic range RF RMS detector with 1 GHz bandwidth based on the dynamic translinear principle and integrated in a BiCMOS process is presented. The main computation is carried out in the current domain and errors due to finite transistor gain are compensated in the structure. To make the circuit suitable for voltage processing, both input and output interface circuits are included. Measurements on a prototype chip demonstrate the practicality of the circuit for an on-chip embedded tests.

Keywords

BiCMOS integrated circuits; detector circuits; integrated circuit testing; radiofrequency integrated circuits; voltage measurement; 1 GHz; BiCMOS process; current domain; dynamic translinear principle; embedded test; finite transistor gain; high-dynamic range RF RMS detector; input interface circuit; on-chip embedded tests; output interface circuits; translinear-based RF RMS detector; voltage processing; Bandwidth; Circuit stability; Circuit testing; Detectors; Dynamic range; RF signals; Radio frequency; Semiconductor device measurement; Shape measurement; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems, 2004. ISCAS '04. Proceedings of the 2004 International Symposium on

Print_ISBN

0-7803-8251-X

Type

conf

DOI

10.1109/ISCAS.2004.1328177

Filename

1328177