DocumentCode :
3354163
Title :
A variational approach for the destriping of modis data
Author :
Bouali, Marouan ; Ladjal, Saïd
Author_Institution :
CNES, INRIA, France
fYear :
2010
fDate :
25-30 July 2010
Firstpage :
2194
Lastpage :
2197
Abstract :
The Moderate Resolution Imaging Spectrometer (MODIS) monitors the earth in 36 spectral bands using a cross-track double-sided continuously rotating scan mirror. The imperfect calibration of the linear arrays of detectors and additional random noise in the internal calibration system induce detector-to-detector stripes, mirror side stripes and noisy stripes visible in most emissive bands. This artefact affects seriously the visual quality and radiometric integrity of measured data. Several approaches including Fourier filtering, wavelet analysis and statistical techniques such as moment matching or histogram matching have been used to reduce striping on MODIS Data. Despite an extensive and diverse destriping literature, most techniques display residual stripes if not strong distortion from the original image. In this paper, we introduce a robust destriping methodology based on a variational approach.
Keywords :
Fourier analysis; filtering theory; geophysical image processing; image matching; image resolution; radiometry; random noise; statistical analysis; wavelet transforms; Earth; Fourier filtering; MODIS data destriping; cross-track double-sided continuously rotating scan mirror; detector-to-detector stripes; emissive band; histogram matching; internal calibration system; linear array; mirror side stripes; moderate resolution imaging spectrometer; moment matching; noisy stripes; radiometric integrity; random noise; spectral band; statistical technique; variational approach; visual quality; wavelet analysis; Histograms; Imaging; MODIS; Mathematical model; Noise; Noise reduction; TV; Destriping; Histogram Matching; Moderate Resolution Imaging Spectrometers; Variational models;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Geoscience and Remote Sensing Symposium (IGARSS), 2010 IEEE International
Conference_Location :
Honolulu, HI
ISSN :
2153-6996
Print_ISBN :
978-1-4244-9565-8
Electronic_ISBN :
2153-6996
Type :
conf
DOI :
10.1109/IGARSS.2010.5652722
Filename :
5652722
Link To Document :
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