Title :
Monte Carlo analysis of nondestructive assay techniques for highly enriched uranium oxide
Author :
Clarke, S.D. ; Flaska, M. ; Pozzi, S.A.
Author_Institution :
Dept. of Nucl. Eng. & Radiol. Sci., Univ. of Michigan, Ann Arbor, MI, USA
Abstract :
Nondestructive assay (NDA) of uranium samples is typically performed using either active neutron multiplicity counting or passive gamma-ray spectroscopy. For large quantities (around 10 kg) of pure, highly enriched uranium (HEU) such as HEU oxide, active well coincidence counters (AWCCs) are widely used to detect time-correlated neutrons from neutron-induced fission with 3He tubes embedded in a polyethylene moderator. The active source used to induce the fissions is typically americium-lithium (AmLi). The purported advantage of this method over gamma-ray spectroscopic analysis is the greater penetrability of neutrons in the measured samples; however, the degree of this advantage has not been yet quantified in detail. The objective of this work is to perform Monte Carlo simulations of neutron multiplicity and gamma-ray spectroscopic analysis for the determination of the fissile mass of HEU-oxide samples. A range of such samples has been previously measured using both an AWCC and a high-purity germanium (HPGe) detector. Here, the two techniques are directly compared in their ability to detect a range of diverted uranium-oxide masses.
Keywords :
Monte Carlo methods; coincidence techniques; fission; gamma-ray spectroscopy; germanium radiation detectors; neutrons; uranium compounds; 3He tubes; HEU-oxide fissile mass; Monte Carlo analysis; active well coincidence counter; americium-lithium source; high-purity germanium detector; highly enriched uranium oxide; neutron multiplicity counting; neutron penetrability; neutron-induced fission; nondestructive assay technique; passive gamma-ray spectroscopic analysis; polyethylene moderator; time-correlated neutron detection; Isotopes; Polyethylene;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2011 IEEE
Conference_Location :
Valencia
Print_ISBN :
978-1-4673-0118-3
DOI :
10.1109/NSSMIC.2011.6154511