Title :
Thermal neutron imaging with PIN photodiode line scanner and Eu-doped LiCaAlF6 scintillator
Author :
Totsuka, D. ; Yanagida, T. ; Fukuda, K. ; Kawaguchi, N. ; Imoto, Y. Fuj ; Yokota, Y. ; Yoshikawa, A.
Author_Institution :
Nihon Kessho Kogaku Co., Ltd., Tatebayashi, Japan
Abstract :
Thermal neutron imaging using Si PIN photodiode line scanner and Eu-doped LiCaAlF6 crystal scintillator has been developed. The pixel dimensions of photodiode are 1.18 mm (width) × 3.8 mm (length) with 0.4 mm gap and the module has 192 channels in linear array. The emission peaks of Eu-doped LiCaAlF6 after thermal neutron excitation are placed at 370 and 590 nm, and the corresponding photon sensitivities of photodiode are 0.04 and 0.34 A/W respectively. Polished scintillator blocks with a size of 1.18 mm (Width) × 3.8 mm (length) × 5.0mm (thickness) were wrapped by several layers of Teflon tapes as a reflector and optically coupled to the photodiodes by silicone grease. JRR-3 MUSASI beam line emitting 13.5 meV thermal neutrons with the flux of 8 × 105 n/cm2s was used for the imaging test. As a subject for imaging, a Cd plate was moved at the speed of 50 mm/s perpendicularly to the thermal neutron beam. Analog integration time was set to be 416.6 μs, then signals were converted by a delta-sigma A/D converter. After the image processing, we successfully obtained moving Cd plate image under thermal neutron irradiation using PIN photodiode line scanner coupled with Eu-doped LiCaAlF6 scintillator.
Keywords :
analogue-digital conversion; neutron detection; nuclear electronics; p-i-n photodiodes; silicon radiation detectors; solid scintillation detectors; Cd plate; Eu-doped LiCaAlF6 scintillator; JRR-3 MUSASI beam line; Si PIN photodiode line scanner; Teflon tape reflector; analog integration time; delta-sigma A/D converter; photon sensitivity; pixel dimension; thermal neutron excitation; thermal neutron imaging; Dark current; Integrated optics; Optical imaging; Optical reflection; Photonics;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2011 IEEE
Conference_Location :
Valencia
Print_ISBN :
978-1-4673-0118-3
DOI :
10.1109/NSSMIC.2011.6154514