DocumentCode

3354494

Title

Internal And External Frontside Electra-optic Voltage Probing Utilizing A Diode Laser

Author

Thomas, V. ; Russer, P.

Author_Institution

Technische Universita Munchen

fYear

1990

fDate

4-9 Nov 1990

Firstpage

572

Lastpage

573

Keywords

Circuit testing; Conductors; Diode lasers; Gallium arsenide; Laser beams; Optical modulation; Optical sensors; Probes; Surface emitting lasers; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Lasers and Electro-Optics Society Annual Meeting, 1990. LEOS '90. Conference Proceedings., IEEE

Print_ISBN

0-87942-550-4

Type

conf

DOI

10.1109/LEOS.1990.690681

Filename

690681