• DocumentCode
    3354499
  • Title

    Feasibility study on visualization of transient phenomena using high resolution on-line neutron imaging system at J-PARC

  • Author

    Segawa, M. ; Kai, T. ; Ooi, M. ; Takamine, J. ; Kureta, M.

  • Author_Institution
    Japan Atomic Energy Agency, Ibaraki, Iran
  • fYear
    2011
  • fDate
    23-29 Oct. 2011
  • Firstpage
    385
  • Lastpage
    392
  • Abstract
    A neutron energy resolved imaging system with a time-of-flight technique has been newly installed at Japan Proton Accelerator Research Complex (J-PARC) with the aim to investigate more preciously spatial distribution of several elements and crystals including various kinds of materials or substances on transient phenomena. A camera (CMOS, 48 frame/sec) equipped the system allows to obtain one TOF image resolved into narrow energy ranges with an each single pulsed neutron consecutively in the energy region from 0.01 to a few keV. Qualities of the images obtained with the system, such as spatial resolution (defined by modulation transfer function, 1.8 at En~ 0.01 eV), neutron energy selectivity of the system, and capability for visualization of transient phenomena, were examined experimentally. The results obtained in the experiments show that the system can visualize the real-time neutron energy resolved images with a good spatial resolution even at transient phenomena.
  • Keywords
    high energy physics instrumentation computing; neutron beams; neutron radiography; optical transfer function; CMOS; J-PARC; TOF image; crystals; high resolution on-line neutron imaging system; modulation transfer function; narrow energy; neutron energy resolved imaging system; neutron energy selectivity; single pulsed neutron; spatial distribution; time-of-flight technique; transient visualization phenomena; Cameras; Equations; Image resolution; Instruments; Lenses; Mathematical model; Solid modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2011 IEEE
  • Conference_Location
    Valencia
  • ISSN
    1082-3654
  • Print_ISBN
    978-1-4673-0118-3
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2011.6154524
  • Filename
    6154524