Title :
Error-resilient low-power Viterbi decoders via state clustering
Author :
Abdallah, Rami A. ; Shanbhag, Naresh R.
Author_Institution :
ECE Dept., Univ. of Illinois at Urbana-Champaign, Urbana, IL
Abstract :
Low-power Viterbi decoder (VD) architectures based on the principle of error-resiliency are presented in this paper. Power reduction in the add-compare-select units (ACSUs) of a VD is achieved by either overscaling the supply voltage (voltage overscaling (VOS)) or designing at the nominal process corner and supply voltage (average-case design). In either case, the data-dependent timing errors which occur whenever a critical path is excited, are corrected via the application of algorithmic noise-tolerance (ANT). The concept of state clustering is employed to develop efficient estimators for error-correction. Power savings achieved in the presence of VOS and process variations are 71% and 62%, respectively, at a loss of 0.8 dB and 0.6 dB in coding gain in a IBM 130 nm CMOS process.
Keywords :
CMOS integrated circuits; Viterbi decoding; error analysis; CMOS; add-compare-select units; algorithmic noise-tolerance; error-resiliency; low-power Viterbi decoders; state clustering; voltage overscaling; Bit error rate; Clustering algorithms; Computer architecture; Decoding; Energy consumption; Energy efficiency; Error correction; Timing; Viterbi algorithm; Voltage; Algorithmic Noise Tolerance; Error Resiliency; Process Variations; Viterbi Decoder; Voltage overscaling;
Conference_Titel :
Signal Processing Systems, 2008. SiPS 2008. IEEE Workshop on
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4244-2923-3
Electronic_ISBN :
1520-6130
DOI :
10.1109/SIPS.2008.4671766