• DocumentCode
    3354950
  • Title

    Evaluation of aged distribution terminations by characterization techniques

  • Author

    Han, Jae Hong ; Lee, Byung Sung ; Han, Yong Heui

  • Author_Institution
    Korea Electr. Power Res. Inst., Taejon, South Korea
  • Volume
    2
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    691
  • Abstract
    This study describes the reliability assessment of 13 years service-aged distribution terminations using characterization techniques such as SEM, ESCG DSC/OIT, FTIR, NMR and so on. Characterization of these terminations revealed that the surface of weathersheds had micro-cracks and chalking of fillers by surface aging. Elemental analysis of weathersheds showed that the carbon was decreased and the oxygen was increased due to a little oxidation reaction. In the analysis of oxidation induction time and chemical structure, there were no differences between new and aged terminations. From this study it can be considered that these terminations are relatively sound up to the present. But, composition of material for weathersheds was varied with time and field site. It was confirmed that environmental factors had an effect on the aging through the composition change
  • Keywords
    ageing; electric breakdown; environmental degradation; insulating materials; power distribution lines; power system reliability; 13 y; 13 years service-aged distribution terminations; DSC/OIT; ESCG; FTIR; NMR; SEM; aged distribution terminations; characterization techniques; chemical structure; filler chalking; micro-cracks; oxidation induction time; oxidation reaction; surface; weathersheds; Aging; Atmospheric measurements; Chemical analysis; Chemical elements; Microstructure; Nuclear magnetic resonance; Oxidation; Pollution measurement; Polymers; Scanning electron microscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 1999 Annual Report Conference on
  • Conference_Location
    Austin, TX
  • Print_ISBN
    0-7803-5414-1
  • Type

    conf

  • DOI
    10.1109/CEIDP.1999.807899
  • Filename
    807899