DocumentCode :
3355007
Title :
Flashover behavior of semiconducting glazed insulators under positive switching impulse stress at different climatic conditions
Author :
Elsasser, O. ; Feser, K.
Author_Institution :
Inst. of Power Transmission & High Voltage Technol., Stuttgart Univ., Germany
Volume :
2
fYear :
1999
fDate :
1999
Firstpage :
711
Abstract :
This paper deals with the flashover voltage of semiconducting glazed insulators under positive switching impulse stress. The measurements are carried out with clean insulators. The results are compared to those obtained earlier with porcelain and composite insulators to show the benefits of the semiconducting glazed insulator technology. All tests are performed in an environmental chamber. The temperature is ranged between 10°C and 40°C in steps of 10°C. In each temperature step the relative humidity is varied between 10% and 95%. The behavior of the flashover voltage is evaluated over the relative and the absolute humidity. A temperature correction factor is given. The sole influence of the absolute humidity on the flashover voltage can be derived after applying the temperature correction to the measured values. The different flashover behavior of the semiconducting glazed insulator can be explained by its changed voltage distribution. Therefore the potential distribution along the semiconducting glazed insulator is measured with AC, DC and different impulse voltages. From the measurements and a field calculation a simple equivalent circuit is developed to calculate the potential distribution for various voltage stresses
Keywords :
composite insulators; environmental testing; equivalent circuits; flashover; humidity; impulse testing; insulator testing; porcelain insulators; voltage distribution; 10 to 40 degC; absolute humidity; clean insulators; climatic conditions; equivalent circuit; flashover voltage; positive switching impulse stress; potential distribution; relative humidity; semiconducting glazed insulators; temperature correction factor; Flashover; Humidity; Insulation; Performance evaluation; Porcelain; Semiconductivity; Stress; Temperature; Testing; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1999 Annual Report Conference on
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-5414-1
Type :
conf
DOI :
10.1109/CEIDP.1999.807904
Filename :
807904
Link To Document :
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