• DocumentCode
    3355032
  • Title

    Fast simulation of Markovian reliability/availability models with general repair policies

  • Author

    Juneja, S. ; Shahabuddin, P.

  • Author_Institution
    Dept. of Oper. Res., Stanford Univ., CA, USA
  • fYear
    1992
  • fDate
    8-10 July 1992
  • Firstpage
    150
  • Lastpage
    159
  • Abstract
    Markovian models of highly reliable systems are considered. An importance sampling based variance reduction technique known as failure biasing has been found to be very useful in the fast Monte Carlo simulation of such systems. The authors show by examples that existing failure biasing heuristics break down for systems which involve more general repair/recovery policies that are common in practice. This motivated a detailed look at the theory of failure biasing from a different perspective than what has been done before, i.e., the effect of failure biasing on sample paths of the Markov chain that involve cycles. This cycling perspective is used to give a much simpler proof of the established fact that existing failure biasing heuristics produce an order of magnitude increase in simulation efficiency over standard simulation, for a class of Markovian systems with simple repair policies. This approach allows the development of theory and efficient heuristics for systems with the more general repair policies.<>
  • Keywords
    Markov processes; Monte Carlo methods; digital simulation; fault tolerant computing; Markovian reliability/availability models; Monte Carlo simulation; failure biasing; failure biasing heuristics; fast simulation; general repair policies; sampling based variance reduction technique; Availability; Computational modeling; Discrete event simulation; H infinity control; Length measurement; Monte Carlo methods; Operations research; Reliability theory; State-space methods; Stochastic systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Fault-Tolerant Computing, 1992. FTCS-22. Digest of Papers., Twenty-Second International Symposium on
  • Conference_Location
    Boston, MA, USA
  • Print_ISBN
    0-8186-2875-8
  • Type

    conf

  • DOI
    10.1109/FTCS.1992.243605
  • Filename
    243605