• DocumentCode
    3355148
  • Title

    Design of fully exercised SFS/SCD logic networks

  • Author

    Nanya, T. ; Hatakenaka, S. ; Onoo, R.

  • Author_Institution
    Dept. of Electr. Eng., Tokyo Inst. of Technol., Japan
  • fYear
    1992
  • fDate
    8-10 July 1992
  • Firstpage
    96
  • Lastpage
    103
  • Abstract
    The authors contribute two important design techniques to the realization of a large logic network that effectively achieves the goal of being totally self-checking. A systematic design method is presented for strongly fault-secure (SFS) and strongly code-disjoint (SCD) sequential circuits which can be used as embedded circuits with the inputs having no need to be monitored by any checker. Second, a remapping technique is presented for embedded logic functions of combinational and sequential circuits interconnected in cascade. The technique allows the embedded input interface of each component circuit to be fully exercised in normal operation so that the entire logic network proves to be SFS and SCD.<>
  • Keywords
    combinatorial circuits; fault location; logic testing; sequential circuits; combinatorial circuits; embedded circuits; embedded input interface; fully exercised SFS/SCD logic networks; remapping technique; sequential circuits; strongly code-disjoint; strongly fault-secure; totally self-checking; Circuit faults; Circuit synthesis; Combinational circuits; Design methodology; Integrated circuit interconnections; Logic circuits; Logic design; Logic functions; Monitoring; Sequential circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Fault-Tolerant Computing, 1992. FTCS-22. Digest of Papers., Twenty-Second International Symposium on
  • Conference_Location
    Boston, MA, USA
  • Print_ISBN
    0-8186-2875-8
  • Type

    conf

  • DOI
    10.1109/FTCS.1992.243611
  • Filename
    243611