Title :
The fast power thyristors
Author :
Brylevsky, V.I. ; Kardo-Sysoev, A.F. ; Lelikov, Y.S. ; Smirnova, I.A. ; Tohashnikov, I.G. ; Karavaev, V.V.
Author_Institution :
A.F. Ioffe Physicotech. Inst., Acad. of Sci., St. Petersburg, Russia
fDate :
June 29 1997-July 2 1997
Abstract :
Properties of two types of fast pulse power thyristors are presented. The first type, high current thyristors (HCT), have been designed for switching on pulse current from 500 A to 6000 A. The second type, medium current thyristors (MCT) have been designed for switching on pulse currents from 100 amperes to 1000 amperes. Operating voltage for both types of thyristors can be as high as 1800 V. Presented thyristors have reverse conductivity have been designed for short pulse application (submicrosecond range of pulse duration). Thyristor testing has been made in low inductance L/sub S/C/sub S/R/sub L/ circuits with active loads (R/sub L/). The following parameters have been registered: current rise time (at 0.1-0.9 levels), maximum pulse current, delay time and voltage. Pulse power and energy losses have been calculated by using current-time and voltage-time transient curves. It has been shown, that there is a range of currents in which current rise time is nearly constant and switching efficiency is high enough for both types of thyristors.
Keywords :
losses; pulsed power switches; testing; thyristor applications; 100 to 6000 A; 1800 V; active loads; current rise time; current-time transient curve; delay time; energy losses; fast pulse power thyristors; high current thyristors; low inductance L/sub S/C/sub S/R/sub L/ circuits; maximum pulse current; medium current thyristors; operating voltage; pulse currents switching; pulse power losses; reverse conductivity; short pulse application; switching efficiency; thyristor testing; voltage-time transient curve; Capacitors; Cathodes; Circuit testing; Delay effects; Energy loss; Inductance; MOSFETs; Silicon; Thyristors; Voltage;
Conference_Titel :
Pulsed Power Conference, 1997. Digest of Technical Papers. 1997 11th IEEE International
Conference_Location :
Baltimore, MA, USA
Print_ISBN :
0-7803-4213-5
DOI :
10.1109/PPC.1997.674521