DocumentCode
3355307
Title
A dual-threshold method for photon counting imaging with the EMCCD
Author
Zhou, Beibei ; Chen, Qian ; He, Weiji ; Zhang, Wenwen
Author_Institution
Ministerial Key Lab. of JGMT, Nanjing Univ. of Sci. & Technol., Nanjing, China
fYear
2010
fDate
26-29 Sept. 2010
Firstpage
3333
Lastpage
3336
Abstract
A dual-threshold method is proposed in this paper to reduce the spurious photon events in photon counting imaging with a thermoelectric cooling electron multiplying charge coupled device (EMCCD). Using the thresholds in both spatial and time domains, the read noise, dark signal and clock induced charges (CIC) can be filtered simultaneously. The theory and measurements of the dual-threshold technique are presented. The results show that this method works better than 5σ threshold method in restoring photon images with the EMCCD of the working temperature at -20 °C. The sensitivity of thermoelectric cooling EMCCDs can be effectively improved by the dual-threshold technique. Photon images could be still restored under the illumination level of 0.1e-/pixel/frame.
Keywords
cooling; image restoration; photon counting; single photon emission computed tomography; thermoelectric devices; clock induced charge; dark signal; dual-threshold method; electron multiplying charge coupled device; illumination level; photon counting imaging; photon image restoration; read noise; single photon detection; spurious photon event; thermoelectric cooling; Cooling; Image restoration; Imaging; Lighting; Noise; Photonics; Pixel; electron multiplying CCD (EMCCD); low light level; photon counting imaging; photon electron (PE); single photon detection; spurious photon event (SPE);
fLanguage
English
Publisher
ieee
Conference_Titel
Image Processing (ICIP), 2010 17th IEEE International Conference on
Conference_Location
Hong Kong
ISSN
1522-4880
Print_ISBN
978-1-4244-7992-4
Electronic_ISBN
1522-4880
Type
conf
DOI
10.1109/ICIP.2010.5652803
Filename
5652803
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