Title :
Numerical simulation of generation in n-SI-n structures
Author :
Viallet, J.E. ; Picoli, Gilbert ; Turki, Kaïs
Author_Institution :
Centre National d´´Etudes des Telecommunications - France
Keywords :
Boundary conditions; Charge carrier processes; Doping; Electron traps; Iron; Numerical simulation; Photorefractive effect; Poisson equations; Radiative recombination; Semiconductor materials;
Conference_Titel :
Semi-Insulating III-V Materials, 1992 Proceedings of the 7th Conference on
Print_ISBN :
0-7503-0242-9
DOI :
10.1109/SIM.1992.752719